DC I-V, C-V, and Pulse in One Test Environment

• Intuitive, point-and-click Windows®-based environment
• Unique Remote PreAmps extend the resolution of SMUs to 0.1fA
• C-V instrument makes C-V measurements as easy as DC I-V
• Pulse and pulse I-V capabilities for advanced semiconductor testing
• Scope card provides integrated scope and pulse measure functionality
• Self-contained PC provides fast test setup, powerful data analysis, graphing and printing, and on-board mass storage of test results
• Unique browser-style Project Navigator organizes tests by device type, allows access to multiple tests, and provides test sequencing and looping control
• Built-in stress/measure, looping, and data analysis for point-and-click reliability testing, including five JEDEC compliant sample tests
• Integrated support for a variety of LCR meters, Keithley switch matrix configurations, and both Keithley Series 3400 and Keysight 81110 pulse generators
• Includes software drivers for leading analytical probers